VLSI Design and Test
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
| ISBN: | 9789811074691 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 815 |
| Produktart: | Kartoniert / Broschiert |
| Herausgeber: | Dasgupta, Sudeb Kaushik, Brajesh Kumar Singh, Virendra |
| Verlag: | Springer Singapore |
| Veröffentlicht: | 22.12.2017 |
| Untertitel: | 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers |
| Schlagworte: | Analog/Mixed Signal Architecture and CAD Circuits Design Verification Devices and Technology – I Devices and Technology – II Digital circuits Digital design Embedded systems Emerging Technologies and Memory |