Resolving locations of defects in superconducting transmon qubits
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
| Autor: | Bilmes, Alexander |
|---|---|
| ISBN: | 9783731509677 |
| Sprache: | Englisch |
| Seitenzahl: | 128 |
| Produktart: | Kartoniert / Broschiert |
| Verlag: | KIT Scientific Publishing |
| Veröffentlicht: | 09.12.2019 |
| Schlagworte: | Defektspektroskopie mitt elektrischer und elastischer Felder Materialdefekte und Dekohärenz Physik Quanten Bits Quantenrechner Quantum bit Transmon Qubit material defects and decoherence quantum computing spectroscopy of defects with dc-electric and elastic fields transmon qubit |