Design, Automation, and Test in Europe
The Design Automation and Test in Europe, DATE, is Europe’s leading international electronic systems design conference for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. It combines the conference with Europe’s leading international ex- bition for electronic design, automation and test. To celebrate the tenth anniversary of DATE, we have compiled this book with the aim to highlight some of the most influential technical contributions from ten years of DATE. Selecting 30 papers, only 3 papers from each year, is a challenging endeavor. Although the impact of papers from the first years of DATE can be det- mined through various citation indexes, the impact from the later years still have to be seen. Together with all 10 Program Chairs, we have made a selection of the most influential papers covering the very broad range of topics which is characteristic for DATE.
| ISBN: | 9789048176533 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 516 |
| Produktart: | Kartoniert / Broschiert |
| Herausgeber: | Lauwereins, Rudy Madsen, Jan |
| Verlag: | Springer Netherland |
| Veröffentlicht: | 19.10.2010 |
| Untertitel: | The Most Influential Papers of 10 Years DATE |
| Schlagworte: | CMOS Embedded System IEEE 80 circuit compiler digital system electronics embedded systems interconnect network on chip (NoC) |
Dr. Rudy Lauwereins is the General Chair for DATE 2007, Dr. Jan Madsen is the Technical Chair.